On May 1, 2007 Schaefer Technologie GmbH have been appointed as exclusive distributor and marketing partner for the XE-Series of scanning probe microscopes manufactured by Park Systems Corp. (former PSIA) in Germany, Austria, Switzerland and Eastern Europe.
The innovative XE AFM product line resolves the problems of non-linearity and non-orthogonality associated with conventional piezo scanners. The z scanner, that controls the vertical movement of the AFM cantilever, is completely decoupled from the x-y scanner which moves the sample in the horizontal plane. Fast z-servo response enables True Non-Contact mode AFM measurements.
Visit this TransGulf's Supplier @ http://www.schaefer-tec.com/ENDEX.HTM